Products

Vision machines & inspection systems

From wafer handling to micro-optics inspection: the AV and PI-1000 machine lines, plus deep-learning AI vision for defects rules can't define.

AV9000 Amethyst micro-optics inspection machine, door open

A deep-learning model learns from good and defective images, then highlights a crack on a textured part

New · AI Vision

AI vision inspection

Deep learning that learns what "good" looks like from your sample images, for defects too variable for rule-based vision.

Learnsfrom good & bad images

Adaptsto texture & variation

Classifiesdefects by type

Cosmetic defects
Surface anomalies
Defect classification
Assembly verification
Difficult OCR

Rule-based vision

Precise measurement & gauging
Fixed, well-defined features
Barcodes & 2D codes
Robot guidance

AI vision

Defects that vary in shape & size
Natural or textured surfaces
Judgements that are hard to put into rules
Sorting defects into classes

Most lines get the best result by combining both, and we'll recommend the right mix for yours.

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AV1000WL

Wafer loader

A flexible robotic module that automates wafer and tray loading, with vision guidance to protect every wafer it handles.

<50 seccycle time per wafer

8″ & belowwafer, or tray

>168 hrsmean time between failure

Recipe-driven
Cassette mapping
Cross-slot protection
Touch-screen
Customisable end effector

Recipe-driven operation automates loading and unloading for maximum uptime, while cassette mapping and cross-slotted wafer detection protect wafers automatically. The modular design and user-configurable controls make it easy to reconfigure, repair and maintain.

Download the AV1000WL brochure (PDF)

Specification	AV1000WL
Machine dimensions (W × D × H)	731 × 1420 × 1720 mm
Machine weight	250 kg
Utilities	200–240 VAC, 50/60 Hz, 3 kW
Compressed air	6 bar
Wafer size	8″ or tray
Load port	Single metal frame, or dual tray
Cycle time	Below 50 sec per wafer
Uptime	> 95%
Mean time between assist	< 2 hrs
Mean time between failure	> 168 hrs
Door open detection / failure mapping / defect logging / barcode scanning	Standard
2D matrix scanning / OCR	Optional (sample part needed)
Operating system	PC, Windows

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AV9000 · Amethyst

Micro-optics inspection

A high-speed, high-accuracy machine for inspecting cell phone camera lenses, built to eliminate the underkill and overkill that human inspectors struggle with.

3.5 µmpixel resolution

500defect images logged

8 typesprogrammable defect criteria

Bubble
Void
Offset
Stain
Chipping
Adhesive stain
Scratch
Saw dust

Special optics reduce the reflection issues caused by a lens's undulating contour, and every defect specification and consecutive-failure rule is individually user-settable. Handles die sizes from 1.5 to 6 mm and package heights up to 12 mm.

Download the AV9000 brochure (PDF)

Optics model	Amethyst C1x-4M	Amethyst C1.5x-4M	Amethyst C2x-4M
Lens magnification	1×	1.5×	2×
Field of view	11.3 × 11.3 mm	7.5 × 7.5 mm	5.65 × 5.65 mm
Resolution	5.5 µm/pixel	3.7 µm/pixel	2.7 µm/pixel
Accuracy (2D)	11.0 µm	7.4 µm	5.5 µm

Specification	AV9000
Machine dimensions (W × D × H)	1800 × 1800 × 2200 mm
Machine weight	~350 kg
Utilities	200–240 VAC, 50/60 Hz, 3 kW
Compressed air	6 bar
Vibration criteria	VC-E (0.003 mm/s)
Camera	4 MP, monochrome
Lighting	Multi-channel, multi-colour
Uptime	> 95%
Mean time between assist	< 2 hrs
Mean time between failure	> 168 hrs
Door open detection / failure mapping / defect logging (incl. image) / barcode scanning	Standard
2D matrix scanning / OCR	Optional (sample part needed)
Operating system	Windows 7 or later
Options	Custom lens / working distance, PC or rackmount enclosure, special adaptations